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A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)

$1,300.00

A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)

$1,300.00

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Additional information

Journal

IEEE Access

Authors

PEDRAM TABATABAEEMOSHIRI
NARENDRA KUMAR
ANIS SALWA MOHD KHAIRUDDIN
DANIEL TING
VIVEK REGEEV

Keywords

Defect detection, graph, semi-supervised learning, semiconductor wafer, test-induced

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