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An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection

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An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection

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Additional information

Journal

IEEE Access

Authors

MENGYUN LI
XUEYING WANG
HONGTAO ZHANG
XIAOFENG HU

Keywords

YOLOv7-tiny, silicon wafer, object detection, deep learning

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