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Research Materials Available – Subject to Confirmation
Research materials: Availability, pricing, and conditions will be checked. Then, a detailed offer will be provided. Please note: Availability and pricing are subject to author confirmation.
| Journal | IEEE Access |
|---|---|
| Authors | DEVON R. RICHMAN |
| Keywords | Counterfeit detection, microelectronics, SAE AS6171, standards-based testing, supply |
| Research Figures | Available |
| Research Schematics | Available |
| Research Math Analysis | Available |
| Research Simulations | Available |
| Research Control | Available |
| Research Code | Available |
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