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Analysis of Standards-Based Counterfeit Microelectronics Detection Methods

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Analysis of Standards-Based Counterfeit Microelectronics Detection Methods

Analysis of Standards-Based Counterfeit Microelectronics Detection Methods

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Additional information

Journal

IEEE Access
Authors

DEVON R. RICHMAN
MICHAEL H. AZARIAN
DIGANTA DAS
MICHAEL PECHT
Keywords

Counterfeit detection, microelectronics, SAE AS6171, standards-based testing, supply
chain security
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