Automated Internal Defect Identification and Localization Based on a Near-Field SAR Millimeter-Wave Imaging System
$0.00
Automated Internal Defect Identification and Localization Based on a Near-Field SAR Millimeter-Wave Imaging System
$0.00
Research Materials Available – Subject to Confirmation
- Design & Schematics
- Code
- Simulations
- Documentation
- Experimental Data
Research materials: Availability, pricing, and conditions will be checked. Then, a detailed offer will be provided. Please note: Availability and pricing are subject to author confirmation.
Vendor Information
- No ratings found yet!
A Survey of Deep Learning Approaches for Pedestrian Detection in Autonomous Systems
Reviews
There are no reviews yet.